Characterization of a 3D defect using the Expected Improvement algorithm
نویسندگان
چکیده
This paper provides a new methodology for the characterization of a defect embedded in a conductive nonmagnetic plate from the measurement of the impedance variations of an air-cored pancake coil at eddy current frequencies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The efficiency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
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